DocumentCode
3710747
Title
Degradation phenomenon of electrical contacts by using a micro-sliding mechanism
Author
Shin-ichi Wada;Koichiro Sawa
Author_Institution
RD Dept., TMC Syst. Co. Ltd., Kawasaki, Japan
fYear
2015
Firstpage
241
Lastpage
249
Abstract
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mech-anism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed the third mechanism, namely another micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on the sliding, and smaller sized system constituted of commercial parts.
Keywords
"Force","Actuators","Degradation","Transient analysis","Contact resistance","Oscillators"
Publisher
ieee
Conference_Titel
Electrical Contacts (Holm), 2015 IEEE 61st Holm Conference on
Type
conf
DOI
10.1109/HOLM.2015.7355104
Filename
7355104
Link To Document