• DocumentCode
    3710747
  • Title

    Degradation phenomenon of electrical contacts by using a micro-sliding mechanism

  • Author

    Shin-ichi Wada;Koichiro Sawa

  • Author_Institution
    RD Dept., TMC Syst. Co. Ltd., Kawasaki, Japan
  • fYear
    2015
  • Firstpage
    241
  • Lastpage
    249
  • Abstract
    Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillation. They have developed a hammering oscillating mech-anism (HOM) or a micro-sliding mechanism 1 (MSM1) which provides micro-oscillations for electrical contacts. It is shown that each mechanism is able to simulate an actual degradation phenomenon on electrical contacts. And they have also developed the third mechanism, namely another micro-sliding mechanism 2 (MSM2) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges, which has more precise sliding performance, less thermal drift on the sliding, and smaller sized system constituted of commercial parts.
  • Keywords
    "Force","Actuators","Degradation","Transient analysis","Contact resistance","Oscillators"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts (Holm), 2015 IEEE 61st Holm Conference on
  • Type

    conf

  • DOI
    10.1109/HOLM.2015.7355104
  • Filename
    7355104