DocumentCode
3711147
Title
Charging/discharging test to arraying structure of IMM3J solar cell
Author
Masamichi Ohira;Teppei Okumura;Yohei Hagiwara;Mitsunobu Sugai;Jirou Harada;Mitsuru Imaizumi
Author_Institution
Japan Aerospace Exploration Agency, 2-1-1, Sengen, Tsukuba 305-8505, Japan
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
4
Abstract
Inverted metamorphic triple-junction (IMM3J) thin-film solar cells and cell array sheets with IMM3J thin-film cells have been developed at JAXA as next-generation, high-efficiency space solar cells. Charging/discharging tests on the cell array sheets with the IMM3J cells were performed to resolve concerns about a potential increase in damage to the cells due to their thin-film structure. Two kinds of sheet structures with these cells were examined and compared with a conventional CIC structure. The threshold of the differential voltage for the discharge of the sheets was found to be higher than that of the CIC structures. The degradation mode of the IMM3J cells in the CIC structure was cell edge leaks.
Keywords
"Discharges (electric)","Degradation","Arrays"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7355864
Filename
7355864
Link To Document