Investigation of light-induced regeneration phenomena on p-type Cz PERC cells

The PERC cells shows significant efficiency improvement (efficiency gain ≥ 1%), but they suffer from severe light-induced degradation (LID) due to a higher sensibility to bulk carrier lifetime degradation. In order to suppress severe LID behavior on p-type Cz PERC cells, the phenomena of light-induced regeneration (LIR) over time at elevated temperatures during illumination have been investigated. The regeneration behavior at elevated temperature is found and increasing temperature accelerates the regeneration reaction. These LIR behaviors have been further investigated through a LID test to confirm the stability of the regeneration states. From the results, not all of the regeneration states at elevated temperatures are stable. Therefore, the enhanced regeneration efficiency through an optimized LIR treatment is accomplished that the relative efficiency loss is from -4.35% to -2.16%.