• DocumentCode
    3713269
  • Title

    Examination of different adder structures concerning di/dt in a 180nm technology

  • Author

    Andreas Rauchenecker;Timm Ostermann

  • Author_Institution
    Institute for Integrated Circuits, Johannes Kepler University, Austria
  • fYear
    2015
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    In the presented paper we examine and compare different adder structures for their EMC behavior. On the one hand the analysis is carried out for different topologies as Ripple Carry Adder and Kogge Stone Adder. And on the other hand these topologies are realized in different logic styles as standard CMOS, complementary pass transistor logic, buffered NMOS pass transistor and complementary buffered NMOS pass transistor logic. All these variations are compared over di/dt, power consumption, speed / performance and transistor count. Additionally a new topology for the Kogge Stone Adder is introduced.
  • Keywords
    "Adders","Transistors","Standards","Electromagnetic compatibility","CMOS integrated circuits","Logic gates"
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop on the
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2015.7358339
  • Filename
    7358339