Radiated emissions estimation of an integrated circuit based on measurements in GTEM cell

The International standard IEC 61967-2 describes radiated emissions test of ICs by mounting IC test board on a wall port of a TEM/GTEM cell. Therefore a typical GTEM cell has to be modified to incorporate the wall port. However, apart of additional cost, improper modification affects the measured voltage at the GTEM output port. In this paper, we present an attempt to perform IC radiated measurements inside a GTEM cell followed by employing standard algorithms to verify with measurements in a semi-anechoic chamber (SAC). The results based on GTEM measurement indicate an impressive correlation with SAC measurements and can be improved further for IC radiated emissions measurement in a GTEM cell.