Electric probes for fault injection attack

Extracting secret information from an integrated circuit by disturbing it with an electromagnetic (EM) pulse has a growing interest. The success of such a process depends directly on the EM probes used. In this paper, we present the results of the experimental characterization of three electric probes, through their bandwidth and opening width. Strangely, the probe specifically designed to inject high power EM fields turns out to be the least efficient. Another, handmade, transfers only very low power to its victim. The latter is very satisfactory, but only in a preferred direction.