• DocumentCode
    3718529
  • Title

    Dose Rate Switching Technique to Estimate the Low Dose Rate Response of Bipolar Technologies

  • Author

    J. Boch;A. Michez;M. Rousselet;S. Dhombres;L. Dusseau;E. Lorfevre;N. Chatry;N. Sukhaseum;F. Saigne

  • Author_Institution
    IES, Univ. Montpellier, Montpellier, France
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The Switched Dose Rate technique is investigated when devices do not exhibit ELDRS. Experimental data and modeling results are presented and discussed in terms of hardness assurance.
  • Keywords
    "Degradation","Radiation effects","Spontaneous emission","Optical switches","Electron traps"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365604
  • Filename
    7365604
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718529