• DocumentCode
    3718562
  • Title

    Multiple Cell Upset Mechanisms in SRAMs

  • Author

    Alexander I. Chumakov;Armen V. Sogoyan;Anna B. Boruzdina;Anatoly A. Smolin;Alexander A. Pechenkin

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    New experimental results using both ion and laser facilities are presented to analyse four multiple cell upset (MCU) mechanisms in SRAMs. Equations describing basic MCU mechanisms were provided.
  • Keywords
    "Scattering","Random access memory","Radiation effects","Integrated circuits","Junctions","Boundary conditions","Writing"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365638
  • Filename
    7365638
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718562