A Method of Diagnostic Test Generation for Transition Faults

This paper proposes a complete method of diagnostic test generation for transition faults. The method creates a diagnostic test generation model for a pair of transition faults to be distinguished from a given full-scan sequential circuit and employs an ordinary transition fault ATPG tool. The proposed model supports launch-off-capture and launch-off-shift modes which is supported by the ATPG tool. Diagnostic test patterns generated by the proposed method are of the same form as the scan test patterns of the given circuit, i.e., no pattern conversion is necessary. Experimental results show that a commercial transition fault ATPG tool can be utilized in our proposed method using benchmark circuits and, for a given undistinguished pair, the proposed method can generate a test pattern for distinguishing them or prove that they are indistinguishable.