• DocumentCode
    3723734
  • Title

    Overview of voltage sag profile estimation

  • Author

    Ivan B. N. C. Cruz;Athena P. Lavega;Jordan R. C. Orillaza

  • Author_Institution
    Electrical and Electronics Engineering Institute, University of the Philippines Diliman, Quezon City, Philippines
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Voltage sags are considered important because they may cause equipment to malfunction and/or interrupt industrial processes and commerce. There is a need for voltage sag profile estimation, because voltage monitoring equipment may prove costly for utilities. This paper provides a review of existing work on voltage sag profile estimation. The methods under sag profile estimation were classified as: (1) model- and (2) measurement-based. This classification is useful in selecting the sag profile estimation method based on the information available. The first group consists of the method of fault positions, the method of critical distances, and the bus impedance matrix and voltage sags matrix method while the second group consists of normalized voltage profile curve-fitting, disturbance circuit, Kalman filter, estimation through fault location and identification, voltage sensitivity method, and transient state estimation.
  • Keywords
    "Circuit faults","Voltage fluctuations","Estimation","Impedance","Power quality","Voltage measurement","Integrated circuit modeling"
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2015 - 2015 IEEE Region 10 Conference
  • ISSN
    2159-3442
  • Print_ISBN
    978-1-4799-8639-2
  • Electronic_ISBN
    2159-3450
  • Type

    conf

  • DOI
    10.1109/TENCON.2015.7372977
  • Filename
    7372977