• DocumentCode
    3723867
  • Title

    Induced sheath voltage in double circuit

  • Author

    M. Shaban;M. A. Salam;S. P. Ang;M.M. Poulose;William Voon

  • Author_Institution
    Dept. of Electrical and Electronic Engineering, Faculty of Engineering, Institut Teknologi Brunei, Brunei Darussalam
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we calculated the induced sheath voltage in metallic sheath/shield of single-core cables operating in double circuit by considering influence of arrangement and phase distance; with the aim of providing optimal value of phase distance and proper arrangement to reduce the induced voltage. Five different arrangements of the cables are used to investigate the effect of a single point bonding and the double point bonding on induced voltage. Formulae for different arrangements are derived using IEEE guide to calculate induced sheath voltage. Out of five arrangements, independent horizontal and vertical arrangements have provided better results. It is found that the independent horizontal arrangement provides lesser maximum induced voltage of 132 V/km but higher overall induced sheath voltage of 64.28 V/km when compared to the vertical arrangement. The vertical arrangement has the values of maximum induced sheath voltage of 138.8 V/km and the overall induced sheath voltage of 27.79 V/km. This causes obvious decrease in the circulating current in the metal shield of the cable which makes independent vertical arrangement better than independent horizontal arrangement with respect to personnel safety. These findings can be used to suggest proper phase distance, radius of the cables and their arrangements when operating in double circuit to reduce the induced sheath voltage in metal sheath of a cable.
  • Keywords
    "Cable shielding","Bonding","Mathematical model","Power cables","Conductors","Integrated circuits","Metals"
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2015 - 2015 IEEE Region 10 Conference
  • ISSN
    2159-3442
  • Print_ISBN
    978-1-4799-8639-2
  • Electronic_ISBN
    2159-3450
  • Type

    conf

  • DOI
    10.1109/TENCON.2015.7373111
  • Filename
    7373111