• DocumentCode
    3724119
  • Title

    Patent Citation Recommendation for Examiners

  • Author

    Tao-yang Fu;Zhen Lei;Wang-Chien Lee

  • fYear
    2015
  • Firstpage
    751
  • Lastpage
    756
  • Abstract
    There is a consensus that U. S. patent examiners, who are responsible for identifying prior art relevant to adjudication of patentability of patent applications, often lack the time, resources and/or experience necessary to conduct a dequateprior art search. This study aims to build an automatic and effective system of patent citation recommendation for patent examiners. In addition to focusing on content and bibliographic information, our proposed system considers another important piece of information that is known by patent examiners, namely, applicant citations. We integrate applicant citations and bibliographic information of patents into a heterogeneous citation bibliographic network. Based on this network, we explore metapaths based relationships between a query patent application and a candidate prior patent and classify them into two categories:(1) Bibliographic meta-paths, (2) Applicant Bibliographic metapaths. We propose a framework based on a two-phase ranking approach: the first phase involves selection of a candidate subset from the whole U. S. patent data, and the second phase uses supervised learning models to rank prior patents in the candidate subset. The results show that both bibliographic informationand applicant citation information are very useful for examiner citation recommendation, and that our approach significantly outperforms a search engine.
  • Keywords
    "Patents","Art","Search problems","Supervised learning","Data mining","Computer science","Search engines"
  • Publisher
    ieee
  • Conference_Titel
    Data Mining (ICDM), 2015 IEEE International Conference on
  • ISSN
    1550-4786
  • Type

    conf

  • DOI
    10.1109/ICDM.2015.151
  • Filename
    7373384