DocumentCode
3726338
Title
Optical detection of micro defect by single-pixel imaging
Author
K. Shibuya;Y. Mizutani;H. Yamamoto;T. Yasui;T. Iwata
Author_Institution
Graduate School of Advanced Technology and Science, The Tokushima University, 2-1 Minami-Josanjima-cho, Tokushima, Japan
Volume
3
fYear
2015
Firstpage
1
Lastpage
2
Abstract
We propose an optical detection method of micro defect by single-pixel imaging microscopy. Our results demonstrate the micro defect imaging by detecting an anisotropic scattered light on mirror surface.
Keywords
"Optical imaging","Optical scattering","Optical sensors","Image reconstruction","High-speed optical techniques","Geometrical optics"
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015 11th Conference on
Type
conf
DOI
10.1109/CLEOPR.2015.7376458
Filename
7376458
Link To Document