• DocumentCode
    3733033
  • Title

    Advanced quality control at raw material kickoff stage

  • Author

    Xiaofeng Shui;Aoyu Shangguan;Yanju Yu;Hailin Gao

  • Author_Institution
    Department of Material Quality Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China
  • fYear
    2015
  • Firstpage
    943
  • Lastpage
    946
  • Abstract
    The quality requirement for raw material is becoming more and stricter along with technical development of semiconductor industry. To meet the high technical requirement, effective quality control at raw material kickoff stage can remarkably reduce quality risk during manufacturing process. This paper will focus on the application of advanced quality control at raw material kickoff stage. The purpose is to reduce manufacturing risk by implementing the advanced quality control methodology at raw material kickoff stage and strictly following the defined requirements during mass production at both supplier plant and foundry.
  • Keywords
    "Raw materials","Quality control","Process control","Correlation","Inspection","Manufacturing processes"
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/IEEM.2015.7385788
  • Filename
    7385788