• DocumentCode
    3735685
  • Title

    Challenges of wafer-level MEMS packaging

  • Author

    Sebastian Schuler-Watkins;Ralf Reichenbach;Uwe Hansen

  • Author_Institution
    Robert Bosch GmbH, Automotive Electronics, MEMS Packaging Development, Reutlingen, Germany
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Today´s packaging standard for consumer MEMS sensors are plastic mold packages of the LGA or QFN type. Multiple chips are placed on a substrate or leadframe, electrically connected by wire bonds and protected by overmolding the sensitive devices. While being a flexible and very effective packaging technology it contributes significantly to the overall sensor dimensions in x-, y- and z-direction. The main driving forces for further market penetration of consumer MEMS sensors are however further thickness and footprint reduction, while retaining performance and reliability at lowest cost. The obvious approach to achieve these required reductions are new packaging technologies that partly or completely remove the substrate, the wire bonds and the encapsulation mold material. This is why we consider wafer level packaging being the future of Consumer MEMS. It will be presented that wafer level MEMS packaging of existing products already realizes a massive reduction of the sensor dimensions while mastering the challenges of this new technology.
  • Keywords
    "Packaging","Micromechanical devices","Application specific integrated circuits","Sensors","Standards","Silicon","Performance evaluation"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Packaging Conference (EMPC), 2015 European
  • Type

    conf

  • Filename
    7390708