DocumentCode
3748072
Title
MOVPE In1?xGaxAs high mobility channel for 3-D NAND memory
Author
E. Capogreco;J. G. Lisoni;A. Arreghini;A. Subirats;B. Kunert;W. Guo;T. Maurice;C.-L. Tan;R. Degraeve;K. De Meyer;G. Van den bosch;J. Van Houdt
Author_Institution
Imec, Kapeldreef 75, B3001 Leuven Belgium
fYear
2015
Abstract
Epitaxially grown In1-xGaxAs is integrated for the first time as replacement of polycrystalline silicon (Si) channel down to 45 nm diameter for 3-D NAND memory application. Channels with different compositions are obtained after careful surface preparation by tuning growth conditions such as: temperature, choice of precursors and flow ratio. In1-xGaxAs shows superior conduction properties than poly-Si channel: higher Ion and transconductance (gm). Potentially good memory operations are also found.
Keywords
"Silicon","Epitaxial growth","Metals","Filling","Correlation","Logic gates","Indium gallium arsenide"
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2015 IEEE International
Electronic_ISBN
2156-017X
Type
conf
DOI
10.1109/IEDM.2015.7409616
Filename
7409616
Link To Document