• DocumentCode
    3758009
  • Title

    EM Injection: Fault Model and Locality

  • Author

    S. Ordas;L. Guillaume-Sage;Philippe Maurine

  • Author_Institution
    LIRMM, Univ. of Montpellier, Montpellier, France
  • fYear
    2015
  • Firstpage
    3
  • Lastpage
    13
  • Abstract
    EM injection recently emerged as an effective medium for fault injection. This paper presents an analysis of the IC susceptibility to EM pulses. It highlights that faults produced by EM pulse injection are not timing faults but correspond to a different model which is presented in this paper. This model also allows to explain experimental results introduced in former communications.
  • Keywords
    "Circuit faults","Timing","Clocks","Generators","Time factors","Integrated circuit modeling"
  • Publisher
    ieee
  • Conference_Titel
    Fault Diagnosis and Tolerance in Cryptography (FDTC), 2015 Workshop on
  • Type

    conf

  • DOI
    10.1109/FDTC.2015.9
  • Filename
    7426147
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3758009