• DocumentCode
    3758474
  • Title

    Estimation of minority carrier lifetime in InGaN single junction solar cell

  • Author

    Md. Zahangir Alom;Md. Soyaeb Hasan;Md. Rafiqul Islam;Ibrahim Mustafa Mehedi;Abdullah M. Dobaie

  • Author_Institution
    Dept. of Electrical and Electronic Engineering (EEE), Khulna University of Engineering & Technology (KUET), Bangladesh
  • fYear
    2015
  • Firstpage
    257
  • Lastpage
    260
  • Abstract
    The parameters that influence the performance of solar cell, minority carrier lifetime is a crucial one. The increase of minority carrier lifetime results in higher conversion efficiency. Minority carrier lifetime is determined and analyzed for InGaN single junction solar cell at different excess carrier concentrations by considering the effect of radiative, Auger, Shockley-Read-Hall (SRH) and surface recombination. Since InGaN is a direct bandgap material it is found that radiative recombination is the dominating mechanism for determining the minority carrier lifetime.
  • Keywords
    "Radiative recombination","Photovoltaic cells","Charge carrier lifetime","Photonic band gap","Charge carrier processes","Junctions"
  • Publisher
    ieee
  • Conference_Titel
    Electrical & Electronic Engineering (ICEEE), 2015 International Conference on
  • Print_ISBN
    978-1-5090-1939-7
  • Type

    conf

  • DOI
    10.1109/CEEE.2015.7428271
  • Filename
    7428271