DocumentCode
3758474
Title
Estimation of minority carrier lifetime in InGaN single junction solar cell
Author
Md. Zahangir Alom;Md. Soyaeb Hasan;Md. Rafiqul Islam;Ibrahim Mustafa Mehedi;Abdullah M. Dobaie
Author_Institution
Dept. of Electrical and Electronic Engineering (EEE), Khulna University of Engineering & Technology (KUET), Bangladesh
fYear
2015
Firstpage
257
Lastpage
260
Abstract
The parameters that influence the performance of solar cell, minority carrier lifetime is a crucial one. The increase of minority carrier lifetime results in higher conversion efficiency. Minority carrier lifetime is determined and analyzed for InGaN single junction solar cell at different excess carrier concentrations by considering the effect of radiative, Auger, Shockley-Read-Hall (SRH) and surface recombination. Since InGaN is a direct bandgap material it is found that radiative recombination is the dominating mechanism for determining the minority carrier lifetime.
Keywords
"Radiative recombination","Photovoltaic cells","Charge carrier lifetime","Photonic band gap","Charge carrier processes","Junctions"
Publisher
ieee
Conference_Titel
Electrical & Electronic Engineering (ICEEE), 2015 International Conference on
Print_ISBN
978-1-5090-1939-7
Type
conf
DOI
10.1109/CEEE.2015.7428271
Filename
7428271
Link To Document