DocumentCode
3758893
Title
Progresses with realizations of Si Av LEDs (650-750nm wavelength) in CMOS and RF Bipolar Integrated Circuitry - Designs and applications
Author
Lukas W. Snyman;Kakai Xu;Jean-Luc Polleux
Author_Institution
Telecommunications Group, Department of Electrical Engineering, School of Science and Engineering, University of South Africa (UNISA), P.O. Box 392, Pretoria, South Africa 0001
fYear
2015
Firstpage
6
Lastpage
12
Abstract
Silicon Avalanche-based p+nn+ Light Emitting Devices (SiAvLEDs) have been developed in a silicon 0.35 micron RF bi-polar process with emission intensities up to 200 nWμm-1. The spectral range is in the 600 nm to 850 nm wavelength region. The achieved emitted optical intensity is 100 fold better as compared with recent other published work for nearest related devices. Particularly, evidence has been obtained that light emission in silicon are strongly related to scattering mechanisms are strongly dependent on the high density n+ dopant matrix of phosphorous atoms in silicon that has been exposed to successive thermal cycles. Specific design aspects are discussed according to carrier energy and momentum engineering concepts and device modeling. Diverse sets of experimental results are presented in this regard. Some potential applications are discussed for next generation realization of various photonic circuits in standard silicon integrated circuitry. Recent achievements and progresses with the high frequency modulation of on-chip optical links using a standard RF bipolar process are discussed. Some potential applications with the realization of micro-optical sensors on silicon chips are presented.
Publisher
ieee
Conference_Titel
Advanced Information Technology, Electronic and Automation Control Conference (IAEAC), 2015 IEEE
Print_ISBN
978-1-4799-1979-6
Type
conf
DOI
10.1109/IAEAC.2015.7428758
Filename
7428758
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