• DocumentCode
    3762373
  • Title

    Study of the impact of dielectric aging on coplanar waveguide performance

  • Author

    Anh Phuong Nguyen;Ulrike L?ders;Frederic Voiron

  • Author_Institution
    IPDIA, R&D, 2 Rue de la Girafe, 14000 Caen, France
  • fYear
    2015
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained.
  • Keywords
    "Stress","Coplanar waveguides","Dielectrics","Silicon","Impedance","Substrates","Temperature measurement"
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop (IIRW), 2015 IEEE International
  • Print_ISBN
    978-1-4673-7395-1
  • Electronic_ISBN
    2374-8036
  • Type

    conf

  • DOI
    10.1109/IIRW.2015.7437078
  • Filename
    7437078