DocumentCode
3762373
Title
Study of the impact of dielectric aging on coplanar waveguide performance
Author
Anh Phuong Nguyen;Ulrike L?ders;Frederic Voiron
Author_Institution
IPDIA, R&D, 2 Rue de la Girafe, 14000 Caen, France
fYear
2015
Firstpage
103
Lastpage
106
Abstract
In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained.
Keywords
"Stress","Coplanar waveguides","Dielectrics","Silicon","Impedance","Substrates","Temperature measurement"
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop (IIRW), 2015 IEEE International
Print_ISBN
978-1-4673-7395-1
Electronic_ISBN
2374-8036
Type
conf
DOI
10.1109/IIRW.2015.7437078
Filename
7437078
Link To Document