• DocumentCode
    3762377
  • Title

    Relaxation-free characterization of Flash programming dynamics along P-E cycling

  • Author

    Jean Coignus;Alexandre Vernhet;Gilles Reimbold;Giulio Torrente;Sophie Renard;David Roy

  • Author_Institution
    CEA, LETI, Minatec Campus, Grenoble, France
  • fYear
    2015
  • Firstpage
    119
  • Lastpage
    121
  • Abstract
    A novel Flash endurance characterization approach is presented, allowing delay-free READ operations and thus a realistic electrostatic description at each cycle before any device relaxation. Systematic measurement of time-dependent drain current during Hot Carrier programming is shown to provide an extended description of Flash programming dynamics with a 5ns time resolution, including tunnel oxide transport.
  • Keywords
    "Current measurement","Degradation","Standards","Programming","Dynamic programming","Reliability","Aging"
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop (IIRW), 2015 IEEE International
  • Print_ISBN
    978-1-4673-7395-1
  • Electronic_ISBN
    2374-8036
  • Type

    conf

  • DOI
    10.1109/IIRW.2015.7437082
  • Filename
    7437082
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3762377