• DocumentCode
    3770152
  • Title

    Three-dimensional ovonic threshold switching model with combination of in-band and trap-to-band hopping mechanism for chalcogenide-based phase-change memory

  • Author

    Chong Chen;Yiqun Wei;Jianwei Zhao;Xinnan Lin;Zhitang Song

  • Author_Institution
    The Key Laboratory of Integrated Microsystems, ECE, Peking University Shenzhen Graduate School, Shenzhen, P.R. China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The snapback effect of amorphous chalcogenide materials has attracted a wide attention. But the mechanism of ovonic threshold switching is still controversial. And two-dimensional model can´t simulate device with complicated boundaries. In this paper we developed a three-dimensional numerical model based on trap to band and in-band transition. The simulation results are compared with experimental data.
  • Keywords
    "Electron traps","Solid modeling","Conductivity","Switches","Threshold voltage","Phase change materials","Mathematical model"
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2015 15th
  • Type

    conf

  • DOI
    10.1109/NVMTS.2015.7457430
  • Filename
    7457430