• DocumentCode
    3781173
  • Title

    Noise analysis of a CDS circuit with offset canceling

  • Author

    Xiao Wang;Zelin Shi;Baoshu Xu

  • Author_Institution
    Shenyang Institute of Automation, Chinese Academy of Sciences, University of the Chinese Academy of Sciences, Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang 110016, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Correlated double samplers(CDS) are widely used in infrared imaging systems which can suppress 1/f noise effectively. Since the concept was raised, many types of CDS have been constructed whose advantages are different in tradeoff among layout area, speed and power dissipation. This paper presents a method of noise analysis for a CDS that has the function of offset canceling, which starts from the transient noise behavior due to noise models in each clock phase. Then based on the theory of stationary random process, power spectrum density(PSD) of output noise is derived. At last a time domain simulation(TDS) is applied to verify the feasibility of the noise analysis method we proposed, which corresponds well. The proposed method provides a noise estimation method of the CDS through which we can deduce contributions from each noise source to the output noise, moreover whose simulation time is much shorter than that of a TDS.
  • Keywords
    "Thermal noise","Random processes","MOSFET","Timing","Capacitors","White noise","Transient analysis"
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2015 IEEE 11th International Conference on
  • Print_ISBN
    978-1-4799-8483-1
  • Electronic_ISBN
    2162-755X
  • Type

    conf

  • DOI
    10.1109/ASICON.2015.7516914
  • Filename
    7516914