• DocumentCode
    378153
  • Title

    Simulations of currents in X-band accelerator structures using 2D and 3D particle-in-cell code

  • Author

    Dolgashev, Valery A. ; Tantawi, Sami G.

  • Author_Institution
    Stanford Linear Accel. Center, Stanford Univ., CA, USA
  • Volume
    5
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    3807
  • Abstract
    The accelerating gradient is one of the crucial parameters affecting design, construction and cost of next-generation linear accelerators. For a specified final energy, the gradient sets the accelerator length, and for a given accelerating structure (and pulse repetition rate) it determines the power consumption. Accelerating gradients in the order of 100 MV/m have been reached in short (~ 20 cm) standing wave and traveling wave X-band accelerating structures. But, recent experiments have shown damage to traveling wave accelerating structures at gradients as low as 50 MV/m after 1000 hours of operation. RF breakdown is a probable cause of this damage. An extensive experimental and theoretical program to determine a safe operating gradient for the Next Linear Collider (NLC) is under way in SLAC. The present work is a part of that program
  • Keywords
    accelerator RF systems; beam handling equipment; electron accelerators; electron beams; high energy physics instrumentation computing; linear colliders; particle beam dynamics; 1000 h; 20 cm; NLC; Next Linear Collider; PIC; SLAC; X-band accelerator structures; accelerating gradient; accelerator length; next-generation linear accelerators; particle-in-cell code; power consumption; pulse repetition rate; radiofrequency breakdown; safe operating gradient; traveling wave accelerating structure damage; Acceleration; Costs; Electric breakdown; Geometry; Linear accelerators; Particle accelerators; Physics; Radio frequency; Rectangular waveguides; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-7191-7
  • Type

    conf

  • DOI
    10.1109/PAC.2001.988260
  • Filename
    988260