DocumentCode
378480
Title
Reliability of interleaving filter using planar lightwave circuit
Author
Nounen, H. ; Arai, H. ; Chiba, T. ; Takasugi, S. ; Uetsuka, H.
Author_Institution
Optoelectronic Syst. Lab., Hitachi Cable Ltd., Ibaraki, Japan
Volume
3
fYear
2001
fDate
2001
Firstpage
408
Abstract
We have investigated reliability of an interleaving filter, which consists of Mach-Zehnder interferometer based on a silica planar lightwave circuit. This device is very stable and robust enough to be used over 25 years.
Keywords
Mach-Zehnder interferometers; circuit reliability; optical filters; silicon compounds; wavelength division multiplexing; Mach-Zehnder interferometer; WDM; interleaving filter; reliability; silica planar lightwave circuit; stability; wavelength division multiplexing; Circuits; Interleaved codes; Optical filters; Optical interferometry; Packaging; Programmable control; Silicon compounds; Temperature dependence; Temperature sensors; Wavelength division multiplexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Communication, 2001. ECOC '01. 27th European Conference on
Print_ISBN
0-7803-6705-7
Type
conf
DOI
10.1109/ECOC.2001.989689
Filename
989689
Link To Document