EMP effects on high-T/sub c/ superconducting devices

The results of a study of irreversible damage induced in microstrips made from high-T/sub c/ thin films by high-power electromagnetic pulses is presented. It was demonstrated that at high supercritical currents, the magnetic flux flow process induces fast thermomagnetic instability. The result of this instability is local magnetic flux propagation, and subsequent irreversible damage of the high-T/sub c/ film. The parameter D=(I/sub d/-I/sub c/)/I/sub c/, where I/sub d/ and I/sub c/ are the critical damaging and superconducting-to-dissipative state transition currents, respectively, which represents the capability of the high-T/sub c/ microstrip to withstand supercritical current, depends on the quality and critical current density of the film.