• DocumentCode
    3798639
  • Title

    Switch-Level Techniques

  • Volume
    4
  • Issue
    4
  • fYear
    1987
  • Firstpage
    15
  • Lastpage
    16
  • Keywords
    "Switches","Circuit faults","Circuit testing","Test pattern generators","Circuit simulation","Design automation","Automatic test pattern generation","Switching circuits","Very large scale integration","Electrical fault detection"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1987.295143
  • Filename
    4070013
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3798639