• DocumentCode
    381261
  • Title

    Environmentally friendly, high thermal resistant, low CTE substrate material for semiconductor packaging

  • Author

    Baba, Takayuki

  • Author_Institution
    Circuitry Mater. Res. Lab., Sumitomo Bakelite Co. Ltd., Shizuoka, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    389
  • Lastpage
    390
  • Abstract
    Semiconductor packaging technology has been moving towards increased miniaturization, lighter weight and higher density. Flip Chip packaging is therefore becoming the mainstream packaging technology for next generation devices. The technology trend has been moving towards much finer pitch interconnections between the semiconductor chip and the package substrate, much narrower circuit width on the substrate and a much smaller diameter of the circuitry layer interconnection. Thus, concerns arise regarding mechanical and electrical deterioration and failure at the interconnections. Previously much more focus had been placed on systems utilizing Halogen-free and Pb-free raw materials in order to meet environmental requirements. In this paper, we are reporting a new substrate material for semiconductor packages (Copper-clad-laminate: ELC-4785GS, Prepreg: EI-6785GS, Build-up material: APL-4601) which Sumitomo Bakelite has begun developing.
  • Keywords
    environmental factors; failure analysis; fine-pitch technology; flip-chip devices; semiconductor device packaging; substrates; thermal expansion; thermal resistance; coefficient of thermal expansion; environmental friendliness; failure analysis; fine pitch interconnection; flip-chip packaging; semiconductor packaging; substrate material; thermal resistance; Gold; Integrated circuit interconnections; Materials reliability; Resins; Semiconductor device packaging; Semiconductor device reliability; Semiconductor materials; Substrates; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2002. IEMT 2002. 27th Annual IEEE/SEMI International
  • Print_ISBN
    0-7803-7301-4
  • Type

    conf

  • DOI
    10.1109/IEMT.2002.1032785
  • Filename
    1032785