• DocumentCode
    381776
  • Title

    Silicon micromechanical structures fabricated by electrochemical process

  • Author

    Dantas, Michel O S ; Galeazzo, Elisabete ; Pees, H.E.M. ; Fernandez, Francisco Javier R

  • Author_Institution
    Lab. de Microelectron., Sao Paulo Univ., Brazil
  • Volume
    1
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    575
  • Abstract
    Silicon (Si) micromechanical structures were fabricated by means of sacrificial layers defined with porous silicon (PS) and masked by hydrogen ion implantation with adequate thermal annealing. The fabrication process to remove the PS layers with diluted KOH at room temperature does not cause damage in remaining Si microstructures which have less than 1 μm thickness controlled by the anodization time.
  • Keywords
    annealing; anodisation; elemental semiconductors; etching; ion implantation; micromachining; micromechanical devices; porous semiconductors; silicon; Si; anodization time; electrochemical process; etching; ion implantation; micromachining; micromechanical structures; sacrificial layers; thermal annealing; Annealing; Electrochemical processes; Fabrication; Hydrogen; Ion implantation; Micromechanical devices; Microstructure; Silicon; Temperature control; Thickness control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2002. Proceedings of IEEE
  • Print_ISBN
    0-7803-7454-1
  • Type

    conf

  • DOI
    10.1109/ICSENS.2002.1037163
  • Filename
    1037163