DocumentCode
381776
Title
Silicon micromechanical structures fabricated by electrochemical process
Author
Dantas, Michel O S ; Galeazzo, Elisabete ; Pees, H.E.M. ; Fernandez, Francisco Javier R
Author_Institution
Lab. de Microelectron., Sao Paulo Univ., Brazil
Volume
1
fYear
2002
fDate
2002
Firstpage
575
Abstract
Silicon (Si) micromechanical structures were fabricated by means of sacrificial layers defined with porous silicon (PS) and masked by hydrogen ion implantation with adequate thermal annealing. The fabrication process to remove the PS layers with diluted KOH at room temperature does not cause damage in remaining Si microstructures which have less than 1 μm thickness controlled by the anodization time.
Keywords
annealing; anodisation; elemental semiconductors; etching; ion implantation; micromachining; micromechanical devices; porous semiconductors; silicon; Si; anodization time; electrochemical process; etching; ion implantation; micromachining; micromechanical structures; sacrificial layers; thermal annealing; Annealing; Electrochemical processes; Fabrication; Hydrogen; Ion implantation; Micromechanical devices; Microstructure; Silicon; Temperature control; Thickness control;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2002. Proceedings of IEEE
Print_ISBN
0-7803-7454-1
Type
conf
DOI
10.1109/ICSENS.2002.1037163
Filename
1037163
Link To Document