DocumentCode
383250
Title
EMI power analysis of transient fields from fixed gap ESD
Author
Honda, Masamitsu
Author_Institution
Impulse Phys. Lab. Inc., Yokohama, Japan
Volume
1
fYear
2002
fDate
13-18 Oct. 2002
Firstpage
284
Abstract
Radiated transient fields from fixed gap ESD is experimentally analyzed. The magnitude of di/dt of discharge current is decreased with charge voltage increase. The probability of digital IC´s upset (EMI: electromagnetic interference) is not proportional to charge voltage under fixed gap ESD. A model of impulsive EMI power is proposed.
Keywords
digital integrated circuits; electric charge; electromagnetic interference; electrostatic discharge; EMI power analysis; charge voltage; digital IC upset; discharge current; electromagnetic interference; fixed gap ESD; impulsive EMI; transient fields; Digital integrated circuits; Electromagnetic fields; Electromagnetic interference; Electromagnetic transients; Electrostatic discharge; Electrostatic interference; Receiving antennas; Rubber; Transient analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
Conference_Location
Pittsburgh, PA, USA
ISSN
0197-2618
Print_ISBN
0-7803-7420-7
Type
conf
DOI
10.1109/IAS.2002.1044101
Filename
1044101
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