DocumentCode

3833038

Title

Effect of internal thermal feedback on transistor quiescent stability

Author

P. Mars

Author_Institution

Liverpool Regional College of Technology, Department of Electrical Engineering, Liverpool, UK

Volume

114

Issue

8

fYear

1967

fDate

8/1/1967 12:00:00 AM

Firstpage

1075

Lastpage

1076

Journal_Title

Proceedings of the Institution of Electrical Engineers

Publisher

iet

ISSN

0020-3270

Type

jour

DOI

10.1049/piee.1967.0205

Filename

5249983