DocumentCode
383594
Title
SC and SI techniques performances faced with technological advances [in CMOS]
Author
Desgreys, Patricia ; Tauvel, Antoine ; Loumeau, Patrick
Author_Institution
Ecole Nat. Superieure des Telecommun., Paris, France
Volume
1
fYear
2002
fDate
2002
Firstpage
53
Abstract
This paper proposes to compare switched-capacitors (SC) and switched-currents (SI) technique performances faced with technological advances. Three cells of identical low complexity are analysed and the following performance factors are theoretically evaluated: minimal supply voltage, signal input range, static accuracy, maximal sampling rate, signal to noise ratio and power dissipation. Then, a figure-of-merit is formed and its evolution is reported as a function of time. It shows that SI circuits are less sensitive to the supply voltage scaling than SC circuits as long as transistors operate in the strong inversion region. But, as gate-source overdrive is finally reduced with supply voltage, SNRSI decreases down to a limit calculated in weak inversion mode.
Keywords
CMOS analogue integrated circuits; analogue processing circuits; low-power electronics; switched capacitor networks; switched current circuits; SC techniques; SI techniques; figure-of-merit; gate-source overdrive; inversion region; performance factors; power dissipation; sampling rate; signal input range; signal to noise ratio; static accuracy; supply voltage; switched-capacitor techniques; switched-current technique; voltage scaling; weak inversion mode; CMOS technology; Circuits; Diodes; Performance analysis; Performance evaluation; Sampling methods; Signal analysis; Signal to noise ratio; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN
0-7803-7596-3
Type
conf
DOI
10.1109/ICECS.2002.1045331
Filename
1045331
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