• DocumentCode
    3848492
  • Title

    Extensive SEU Impact Analysis of a PIC Microprocessor for Selective Hardening

  • Author

    Mario García Valderas;Marta Portela Garcia;Celia Lopez;Luis Entrena

  • Author_Institution
    Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • Firstpage
    1986
  • Lastpage
    1991
  • Abstract
    In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to locate weak areas. autonomous emulation is a very powerful tool to locate these areas by executing huge fault injection campaigns. In this work, fault injection has been extensively applied to a PIC18 microprocessor, while executing three different workloads. A 80 million fault campaign has been performed, and results show that a failure rate lower than 1% can be obtained by hardening a 24% of the circuit flip-flops, for the given applications.
  • Keywords
    "Microprocessors","Circuit faults","Circuit testing","Radiation hardening","Performance evaluation","Emulation","Costs","Error analysis","Logic testing","Manufacturing"
  • Journal_Title
    IEEE Transactions on Nuclear Science
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2039581
  • Filename
    5550426