• DocumentCode
    389383
  • Title

    A two-dimensional recruitment model for the skin

  • Author

    Vesentini, S. ; Redaelli, A. ; Montevecchi, F.M.

  • Author_Institution
    Dipt. di Bioingegneria, Politecnico di Milano, Italy
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    168
  • Lastpage
    170
  • Abstract
    In this paper a 2-dimensional recruitment model for a planar soft tissue is presented, able to compute the local collagen fibers displacement caused by the application of a concentrated force and to evaluate the damage of the elastin matrix and on the fibrous component. The model assumption is that the collagen fibers oppose to the force by means of geometrical modification and the generation of traction forces; the scratching of elastin would be driven by the orientation changes of the collagen fibers. With reference to the skin, a layer with thickness equal to 3 mm has been modeled. An applied force of 0.75 N preserve the fibrous component from rupture. This value is the limit value; beyond it the collagen fibers start to fail whereas the elastin matrix disrupts also for lower values. This recruitment model can provide information about the stress state surrounding wounds in the skin, which is of interest because of the role that the stress plays in the healing process.
  • Keywords
    biomechanics; fibres; physiological models; proteins; skin; 2-dimensional recruitment model; 3 mm; elastin matrix damage evaluation; fibrous component preservation; geometrical modification; healing process; local collagen fibers displacement; recruitment model; skin wound; soft tissue; stress state; traction forces generation; Biological tissues; Capacitive sensors; Dermis; Joining processes; Mechanical factors; Recruitment; Skin; Stress; Transmission line matrix methods; Wounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Molecular, Cellular and Tissue Engineering, 2002. Proceedings of the IEEE-EMBS Special Topic Conference on
  • Print_ISBN
    0-7803-7557-2
  • Type

    conf

  • DOI
    10.1109/MCTE.2002.1175059
  • Filename
    1175059