DocumentCode
392638
Title
Local mapping of the oxygen-boron complex in 2×2 cm2 and 10×10 cm2 high-efficiency CZ-Si solar cells by lock-in thermography and LBIC
Author
Rakotoniaina, Jean P. ; Breitenstein, Otwin ; Zhao, Jianhua ; Wang, Aihua ; Green, Martin A. ; Rein, Stefan ; Glunz, Stefan W.
Author_Institution
Max Planck Inst. of Microstructure Phys., Halle, Germany
fYear
2002
fDate
19-24 May 2002
Firstpage
434
Lastpage
437
Abstract
If high efficiency solar cells made from Czochralski material are exposed to sunlight or forward bias, their performance degrades due to a rearrangement of complex which most probably contains oxygen and boron. This degradation, which can be reversed by annealing, is reflected not only in the solar cell parameters but also in the dark I-V characteristics. We have imaged the dark forward current across a 4 cm2 cell and a 100 cm2 cell containing striations by lock-in thermography after annealing the cell at 200°C and after degrading it for 24 hrs. The difference between these two images corresponds to the local action of the B-O complex. We have found that this complex is distributed homogeneously across both cells, and that some observed weak local shunts do not show any recombination-induced degradation. Especially, the striation pattern in the 100 cm2 cell did not react on degradation and annealing.
Keywords
OBIC; annealing; boron; crystal growth from melt; dark conductivity; elemental semiconductors; infrared imaging; oxygen; semiconductor growth; silicon; solar cells; 200 degC; 24 hr; LBIC; Si:O,B; annealing; dark I-V characteristics; dark forward current; degradation; high-efficiency CZ-Si solar cells; local action; local mapping; lock-in thermography; recombination-induced degradation; solar cell parameters; striation pattern; weak local shunts; Annealing; Current measurement; Dark current; Degradation; Diodes; Fluid flow measurement; Optical imaging; Photovoltaic cells; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN
1060-8371
Print_ISBN
0-7803-7471-1
Type
conf
DOI
10.1109/PVSC.2002.1190552
Filename
1190552
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