• DocumentCode
    39770
  • Title

    A Stochastic Sensor Selection Scheme for Sequential Hypothesis Testing With Multiple Sensors

  • Author

    Cheng-Zong Bai ; Katewa, Vaibhav ; Gupta, Vijay ; Yih-Fang Huang

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • Volume
    63
  • Issue
    14
  • fYear
    2015
  • fDate
    15-Jul-15
  • Firstpage
    3687
  • Lastpage
    3699
  • Abstract
    We study the problem of binary sequential hypothesis testing using multiple sensors with associated observation costs. An off-line randomized sensor selection strategy, in which a sensor is chosen at every time step with a given probability, is considered. The objective of this work is to find a sequential detection rule and a sensor selection probability vector such that the expected total observation cost is minimized subject to constraints on reliability and sensor usage. First, the sequential probability ratio test is shown to be the optimal sequential detection rule in this framework as well. Efficient algorithms for obtaining the optimal sensor selection probability vector are then derived. In particular, a special class of problems in which the algorithm has complexity that is linear in the number of sensors is identified. An upper bound for the average sensor usage to estimate the error incurred due to Wald´s approximations is also presented. This bound can be used to set a safety margin for guaranteed satisfaction of the constraints on the sensor usage.
  • Keywords
    approximation theory; reliability; sensor fusion; Wald approximations; binary sequential hypothesis testing; multiple sensors; observation costs; off-line randomized sensor selection strategy; optimal sensor selection probability vector; reliability; safety margin; sensor selection probability vector; sensor usage; sequential detection rule; sequential hypothesis testing; sequential probability ratio test; stochastic sensor selection scheme; Approximation algorithms; Approximation methods; Random sequences; Reliability; Safety; Signal processing algorithms; Testing; Hypothesis testing; SPRT; sensor scheduling; sensor selection; sequential detection; sequential probability ratio test;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2015.2425804
  • Filename
    7093177