DocumentCode
39770
Title
A Stochastic Sensor Selection Scheme for Sequential Hypothesis Testing With Multiple Sensors
Author
Cheng-Zong Bai ; Katewa, Vaibhav ; Gupta, Vijay ; Yih-Fang Huang
Author_Institution
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Volume
63
Issue
14
fYear
2015
fDate
15-Jul-15
Firstpage
3687
Lastpage
3699
Abstract
We study the problem of binary sequential hypothesis testing using multiple sensors with associated observation costs. An off-line randomized sensor selection strategy, in which a sensor is chosen at every time step with a given probability, is considered. The objective of this work is to find a sequential detection rule and a sensor selection probability vector such that the expected total observation cost is minimized subject to constraints on reliability and sensor usage. First, the sequential probability ratio test is shown to be the optimal sequential detection rule in this framework as well. Efficient algorithms for obtaining the optimal sensor selection probability vector are then derived. In particular, a special class of problems in which the algorithm has complexity that is linear in the number of sensors is identified. An upper bound for the average sensor usage to estimate the error incurred due to Wald´s approximations is also presented. This bound can be used to set a safety margin for guaranteed satisfaction of the constraints on the sensor usage.
Keywords
approximation theory; reliability; sensor fusion; Wald approximations; binary sequential hypothesis testing; multiple sensors; observation costs; off-line randomized sensor selection strategy; optimal sensor selection probability vector; reliability; safety margin; sensor selection probability vector; sensor usage; sequential detection rule; sequential hypothesis testing; sequential probability ratio test; stochastic sensor selection scheme; Approximation algorithms; Approximation methods; Random sequences; Reliability; Safety; Signal processing algorithms; Testing; Hypothesis testing; SPRT; sensor scheduling; sensor selection; sequential detection; sequential probability ratio test;
fLanguage
English
Journal_Title
Signal Processing, IEEE Transactions on
Publisher
ieee
ISSN
1053-587X
Type
jour
DOI
10.1109/TSP.2015.2425804
Filename
7093177
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