DocumentCode
398839
Title
An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores
Author
Bernardi, P. ; Rebaudengo, M. ; Reorda, M. Sonza
Author_Institution
Dipt. di Autom. e Inf., Politecnico di Torino, Italy
Volume
1
fYear
2003
fDate
16-19 Sept. 2003
Firstpage
417
Abstract
This paper addresses the issue of diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper. The proposed solution exploits a hardware-implemented compression method that minimizes the amount of data to be transferred from the core to the ATE. The proposed solution takes into account several constraints existing in an industrial environment, such as reducing the time and area overheads required for diagnosis, and minimizing the cost of the external ATE. Experimental results are provided allowing evaluating the benefits and limitations of the adopted solution.
Keywords
automatic test equipment; built-in self test; fault diagnosis; integrated memory circuits; system-on-chip; ATE; BIST; P1500 compliant wrapper; SOC; area overheads reduction; automatic test equipment; built-in self test; compressed diagnostic information; embedded memory cores; hardware implemented compression; industrial environment; minimization; system-on-chip; time reduction; Built-in self-test; Costs; Data mining; Fault diagnosis; Lakes; Logic testing; Read-write memory; Semiconductor memory; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies and Factory Automation, 2003. Proceedings. ETFA '03. IEEE Conference
Print_ISBN
0-7803-7937-3
Type
conf
DOI
10.1109/ETFA.2003.1247736
Filename
1247736
Link To Document