• DocumentCode
    398839
  • Title

    An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores

  • Author

    Bernardi, P. ; Rebaudengo, M. ; Reorda, M. Sonza

  • Author_Institution
    Dipt. di Autom. e Inf., Politecnico di Torino, Italy
  • Volume
    1
  • fYear
    2003
  • fDate
    16-19 Sept. 2003
  • Firstpage
    417
  • Abstract
    This paper addresses the issue of diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper. The proposed solution exploits a hardware-implemented compression method that minimizes the amount of data to be transferred from the core to the ATE. The proposed solution takes into account several constraints existing in an industrial environment, such as reducing the time and area overheads required for diagnosis, and minimizing the cost of the external ATE. Experimental results are provided allowing evaluating the benefits and limitations of the adopted solution.
  • Keywords
    automatic test equipment; built-in self test; fault diagnosis; integrated memory circuits; system-on-chip; ATE; BIST; P1500 compliant wrapper; SOC; area overheads reduction; automatic test equipment; built-in self test; compressed diagnostic information; embedded memory cores; hardware implemented compression; industrial environment; minimization; system-on-chip; time reduction; Built-in self-test; Costs; Data mining; Fault diagnosis; Lakes; Logic testing; Read-write memory; Semiconductor memory; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 2003. Proceedings. ETFA '03. IEEE Conference
  • Print_ISBN
    0-7803-7937-3
  • Type

    conf

  • DOI
    10.1109/ETFA.2003.1247736
  • Filename
    1247736