DocumentCode
403487
Title
Re-configurable bus encoding scheme for reducing power consumption of the cross coupling capacitance for deep sub-micron instruction bus
Author
Wong, Siu-Kei ; Tsui, Chi-Ying
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
130
Abstract
In very deep sub-micron designs, cross coupling capacitances become the dominant factor of the total bus loading and have a significant impact on the power consumption. In this paper, we propose two reconfigurable bus encoding schemes, which are based on the correlation among the bit lines, to reduce the power consumption at the cross coupling capacitances of the instruction buses. The instruction is encoded by flipping and reordering the bit lines during compilation time to reduce the total switching capacitances. A crossbar is used to map back the data to the original instruction code before sending to the instruction decoder. The reordering can be re-configured during run-time by using different configurations in the crossbar. We propose two types of re-configuration, static and dynamic. Static coding uses a fix flipping and re-configuring pattern after the corresponding program is compiled. Dynamic coding allows different re-configuring patterns during program execution. Experimental results show that by using the proposed schemes, significant energy reduction, 17-23%, can be achieved. Comparisons with existing bit lines reordering encoding scheme have also been made and on average more than 15% reduction can be obtained using our method.
Keywords
capacitance; circuit layout CAD; encoding; low-power electronics; reconfigurable architectures; system buses; bit line flipping; bit line reordering; bus loading; compilation time; cross coupling capacitance; crossbar; deep sub-micron instruction bus; dynamic coding; dynamic reconfiguration; fix flipping; instruction decoder; power consumption; program execution; reconfigurable bus encoding scheme; reconfiguring pattern; run-time; static coding; static reconfiguration; switching capacitances; Capacitance; Decoding; Design engineering; Dynamic compiler; Encoding; Energy consumption; Power engineering and energy; Runtime; Statistics; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268838
Filename
1268838
Link To Document