DocumentCode
403673
Title
Placement using a localization probability model (LPM)
Author
Olbrich, Markus ; Barke, Erich
Author_Institution
Inst. of Microelectron. Syst., EDA Group, Hannover, Germany
Volume
2
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
1412
Abstract
We propose a new placement model for global placement. This model uses probabilities to localize the cells. It enables arbitrary levels of placement abstraction. Wire-length estimations at any level can be derived from the model. We present a new placer, that uses a special variant of the proposed model. Examples show that the model properties improve placement quality.
Keywords
cellular arrays; circuit layout CAD; circuit optimisation; integrated circuit layout; probability; cell localization; circuit layout CAD; computer aided design; global placement; integrated circuit layout; localization probability model; placement abstraction; probability; wire length estimations; Analytical models; Circuit simulation; Clustering algorithms; Design automation; Electronic design automation and methodology; Microelectronics; Partitioning algorithms; Runtime; Simulated annealing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1269112
Filename
1269112
Link To Document