DocumentCode
403818
Title
A comprehensive approach to assessing and analyzing 1149.1 test logic
Author
Melocco, Kevin ; Arora, Hina ; Setlak, Paul ; Kunselman, Gary ; Mardhani, Shazia
Author_Institution
Cadence Design Systems - Test Design Automation
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
358
Lastpage
367
Keywords
Application specific integrated circuits; Automatic testing; Design automation; Design for testability; Logic design; Logic testing; Microelectronics; Registers; System testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270858
Filename
1270858
Link To Document