DocumentCode
403853
Title
Automatic multitone alternate test-generaton for rf circuits using behavioral models
Author
Haider, Abrar ; Bhattacharya, Soumendu ; Chatterjee, Abhijit
Author_Institution
School of ECE, Georgia Institute of Technology
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
665
Lastpage
673
Keywords
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Manufacturing; Radio frequency; Semiconductor device testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270895
Filename
1270895
Link To Document