• DocumentCode
    403869
  • Title

    Outlier detection for dppm reduction

  • Author

    Buxton, Paul ; Tabor, Paul

  • Author_Institution
    Test Advantage Ltd.
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    818
  • Lastpage
    827
  • Keywords
    Circuit faults; Circuit testing; Costs; Electrical fault detection; Fault detection; Fault diagnosis; Life testing; Manufacturing processes; Printed circuits; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270914
  • Filename
    1270914
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403869