• DocumentCode
    403891
  • Title

    Optimization of test/diagnosis/rework location(s) and characteristics in electronic systems assembly using real-coded genetic algorithms

  • Author

    Shi, Zhen ; Sandborn, Phillip

  • Author_Institution
    University of Maryland
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    937
  • Lastpage
    946
  • Keywords
    Assembly systems; Cost function; Electronic equipment testing; Fault diagnosis; Genetic algorithms; Manufacturing processes; Optimization methods; Performance evaluation; System testing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271080
  • Filename
    1271080
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403891