DocumentCode

403947

Title

Debug and diagnosis in the age of system-on-a-chip

Author

Molyneaux, Robert

Author_Institution

Sun Microsystems Inc.

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1303

Lastpage

1303

Keywords

Circuit testing; Computer crashes; Failure analysis; Logic arrays; Logic testing; Silicon; Sun; System-on-a-chip; Time to market; Vehicle crash testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271143

Filename

1271143