DocumentCode
406374
Title
Rapid current switching with an endovascular electrode configuration significantly decreases implantable defibrillator thresholds
Author
Dosdall, D.J. ; Sweeney, J.D. ; Brandon, T.A.
Author_Institution
Harrington Dept. of Bioeng., Arizona State Univ., Tempe, AZ, USA
Volume
1
fYear
2003
fDate
17-21 Sept. 2003
Firstpage
179
Abstract
This study sought to demonstrate that defibrillation thresholds (DFTs) for electrical defibrillation of the heart could be reduced significantly with entirely endovascular electrode placements by switching current rapidly between electrode sets. A left ventricular (LV) electrode and custom defibrillator were built. A commercial defibrillation catheter was implanted in 9 swine with shocking coils in the right ventricle (RV) and superior vena cava (SVC). A pectoral (Can) electrode was implanted over the left pectoral muscle. The custom LV electrode was inserted into the middle cardiac vein. Defibrillation thresholds were determined for a control configuration (biphasic shock, RV- → SVC+ + Can+), and for two experimental configurations. One configuration (2/2) split the current between two current paths (RV- → SVC+ + Can+, LV- → SVC+ + Can+) and another (3/3) distributed the current between three current paths (RV → SVC+ + Can+, SVC- + Can- → LV+, LV- → RV+). DFT energy levels were more than 41.7% lower (p= 0.016) for the 2/2 configuration, and more than 42.7% lower (p=0.008) for the 3/3 configuration.
Keywords
biomedical electrodes; cardiology; catheters; defibrillators; neuromuscular stimulation; biphasic shock; cardiac vein; catheter; current switching; defibrillation thresholds; endovascular electrode; heart; implantable defibrillator; left ventricular electrode; pectoral electrode; pectoral muscle; right ventricle; shocking coils; superior vena cava; swine; Catheters; Coils; Defibrillation; Electric shock; Electrodes; Energy states; Heart; Muscles; Static VAr compensators; Veins;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
ISSN
1094-687X
Print_ISBN
0-7803-7789-3
Type
conf
DOI
10.1109/IEMBS.2003.1279556
Filename
1279556
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