Chirped-laser based electron bunch length monitor

Author

Berden, G. ; Knippels, G. ; Oepts, D. ; van der Meer, A.F.G. ; Jamison, S.P. ; Yan, Xiaodong ; MacLeod, A.M. ; Gillespie, W.A.

Author_Institution

FOM Inst. Rijnhuizen, FELIX, Nieuwegein, Netherlands

Volume

1

fYear

2003

fDate

12-16 May 2003

Firstpage

519

Abstract

An electron bunch length monitor will be discussed which is based on the birefringence induced by the Coulomb field of the bunch in an electro-optically active crystal that is placed in close proximity of the beam. This birefringence is used to change the polarization of an external laser probe pulse. Measurements, performed at the FELIX facility, both in sampling mode (where the 1 GHz micropulse repetition rate of the accelerator was used) and in single-shot mode, will be described. In the latter case, the laser pulse is stretched and chirped, which allows the longitudinal bunch profile to be encoded on its spectral content. Issues related to the (sub-picosecond) time resolution will be discussed.

Keywords

birefringence; free electron lasers; measurement by laser beam; particle beam bunching; particle beam diagnostics; 1 GHz; 1 GHz micropulse repetition rate; Coulomb field; FELIX facility; birefringence; chirped-laser based electron bunch length monitor; electro-optically active crystal; longitudinal bunch profile; sampling mode; single-shot mode; sub-picosecond time resolution; Birefringence; Chirp; Electron beams; Laser beams; Laser modes; Laser transitions; Lasers and electrooptics; Monitoring; Optical pulses; Polarization;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the

ISSN

1063-3928

Print_ISBN

0-7803-7738-9

Type

conf

DOI

10.1109/PAC.2003.1288965

Filename

1288965