Electron-beam size measurement with a beam profile monitor using Fresnel zone plates

Author

Nakamura, N. ; Sakai, Hiroki ; Iida, Kazumasa ; Shinoe, K. ; Takaki, H. ; Hayano, H. ; Nomura, M. ; Kamiya, Yushi ; Koseki, Takafumi ; Aoki, Naokazu ; Nakayama, Keisuke

Author_Institution

Inst. for Solid State Phys., Univ. of Tokyo, Kashiwa, Japan

Volume

1

fYear

2003

fDate

12-16 May 2003

Firstpage

530

Abstract

We have designed and constructed a non-destructive and real-time beam profile monitor in the KEK-ATF damping ring to measure the extremely small electron-beam size. The monitor has a microscopic structure where two Fresnel zone plates (FZPs) constitute an x-ray imaging optics. In the monitor system, synchrotron radiation from an electron beam is monochromatized by a silicon crystal and the transverse electron-beam image is twenty-times magnified by the two FZP and detected on the x-ray CCD camera With this monitor, we have succeeded in obtaining a clear electron-beam image and measuring the electron-beam size less than 10 μm. The measured magnification of the imaging optics was in good agreement with the design value.

Keywords

CCD image sensors; X-ray optics; electron accelerators; particle beam diagnostics; synchrotron radiation; zone plates; 10 micron; Fresnel zone plates; KEK-ATF damping ring; Si crystal; beam profile monitor; electron-beam size measurement; extremely small electron-beam size; transverse electron-beam image; x-ray CCD camera; x-ray imaging optics; Damping; Electron beams; Electron optics; Fresnel reflection; Optical microscopy; Radiation monitoring; Size measurement; Synchrotron radiation; Ultraviolet sources; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the

ISSN

1063-3928

Print_ISBN

0-7803-7738-9

Type

conf

DOI

10.1109/PAC.2003.1288968

Filename

1288968