• DocumentCode
    413593
  • Title

    Effect of complexing agent on spray deposited CdTe thin films

  • Author

    Krishna, K. Vamsi ; Dutta, V.

  • Author_Institution
    Centre for Energy Studies, Indian Inst. of Technol., New Delhi, India
  • Volume
    1
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    446
  • Abstract
    Te rich CdTe thin films have been prepared by spray pyrolysis technique using a complexing agent ethylene-diamine-tetra-acetic acid (EDTA) in the precursor solution. The films are characterized using XRD, XPS and PL techniques. XRD studies indicates that the films consist of a mixture of CdTe and Te and the Te peak intensity varies with EDTA concentration. XPS study infers that there is a change over in chemical environment of Te. A broad photoluminescence peak at 1.40 eV is observed in the films with no complexing agent, which can be resolved into two peaks 1.43 and 1.40 eV. The intensities of both peaks increases with EDTA concentration. The stoichiometry in the films can be controlled by varying EDTA concentration, which is because of Cd ions forming stable complexes with EDTA. This hinders the CdTe formation and leaves Te in the elemental form.
  • Keywords
    II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; cadmium compounds; photoluminescence; pyrolysis; semiconductor thin films; spectral line intensity; spray coating techniques; stoichiometry; 1.40 eV; 1.43 eV; CdTe; EDTA; PL techniques; X-ray diffraction; X-ray photoelectron spectra; XPS; XRD; chemical environment; complexing agent; ethylene-diamine-tetra-acetic acid; peak intensity; photoluminescence; precursor solution; spray deposited thin film; spray pyrolysis technique; stoichiometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305316