• DocumentCode
    415896
  • Title

    Power and temperature requirements for refrigerated systems

  • Author

    Copeland, David ; Chan, Albert

  • Author_Institution
    Fujitsu Lab. of America, Packaging Technol. Res., Sunnyvale, CA, USA
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    237
  • Abstract
    As feature dimensions of processors shrink to 100 nanometers and smaller, leakage current becomes a significant part of total power dissipation. The magnitude of power dissipated as leakage current can approach half that of the active current at higher junction temperatures. Leakage current exhibits a strong exponential relationship with temperature. Reduction of junction temperatures from a traditional value of 85 C to a near-ambient value of 25 C can reduce leakage current to a fraction of its usual value, and total power by nearly one-third. Representative leakage current models were chosen for 100, 85 and 65 nm technologies, projected for the years 2003, 2005 and 2007. Using these models, power reduction was calculated for a range of cold plate temperatures from 15 to 25 C. This was compared to compressor power in the same range. When static leakage is 30% at 85 C, total power is lowest at the highest cold plate temperature. When static leakage is 50% at 85 C, the total power becomes nearly constant throughout the range of cold plate temperatures.
  • Keywords
    cooling; integrated circuit design; integrated circuit reliability; leakage currents; microprocessor chips; refrigeration; 100 nm; 65 nm; 85 nm; 85 to 15 C; cold plate temperatures; compressor power; junction temperatures; microprocessor chips; power reduction; processors shrink design; refrigerated systems; reliability; static leakage current; total power dissipation; Cold plates; Cooling; Leakage current; Packaging; Power dissipation; Refrigeration; Temperature dependence; Temperature distribution; Temperature sensors; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
  • Print_ISBN
    0-7803-8357-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.2004.1319180
  • Filename
    1319180