DocumentCode
418056
Title
Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing
Author
Jiang, Hanjun ; Olleta, Beatriz ; Chen, Degang ; Geiger, Randall
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume
1
fYear
2004
fDate
23-26 May 2004
Abstract
Deterministic dynamic element matching (DDEM) is applied to low accuracy DACs for high resolution ADC test. The testing accuracy is impressive while the test cost is relatively low. This work tries to further optimize the DDEM parameters based on improving the test accuracy and reducing the test hardware and computation cost. The optimization is accomplished by theoretical analysis and numerical simulation. Some typical parameter values are suggested by this work.
Keywords
analogue-digital conversion; digital-analogue conversion; integrated circuit testing; mixed analogue-digital integrated circuits; ADC testing; analog-to-digital converters; deterministic dynamic element matching; digital-to-analog converters; parameter optimization; Built-in self-test; Circuit testing; Computational efficiency; Cost function; Digital-analog conversion; Hardware; Histograms; Linearity; Numerical simulation; Signal resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN
0-7803-8251-X
Type
conf
DOI
10.1109/ISCAS.2004.1328347
Filename
1328347
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